Cryostat for Optical and DLTS Measurement
・Equipped with 0.1W at 4.2K compact cryocooler
・With four large windows of Φ14, ultimate temperature is as low as 4.2K.
・No liquid helium required. Measurement of samples at cryogenic temperature is possible for long hours.
・Compressors can be selected from air-cooled and water-cooled
・Temperature is controlled by calibrated censor. Samples can be cooled to desired temperature from room to cryogenic
・For optical measurement, optical axis length is adjustable from 120 to 250mm as specified at the time of production.
|Ultimate Temperature||Below 4.2K|
|Cooldown Time||Less than 120 minutes (to 10K)|
|Temperature Stability||Less than ±0.2K|
|Optical Window||Synthetic Quartz (Ф14(Effective Diameter)×4) (Shield Opening:Ф14×4)|
|Lead Wire for DLTS Measurement||Ф0.2 Teflon Coated Lead Wire|
|Temperature Censor||Si Diode Censor (Calibrated) one|
Compressor,Power Supply: 100V Single-phase 15A
|Cryostat for Optical, DLTS Measurement||CRT-A010-SE00|
|Temperature Controller||Model 325|
※Specifications may change depending on usage conditions.
Please feel free to contact us about our product.
Our consultants will propose plans that fit your needs.